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Infrastructure - "C"

This setup very sensitively measures the light emitted from a sample upon electron beam impact. It is built as an add-on to a FEI XL30 scanning electron microscope.

Chemical Inkjet printer

Spectra Physics Hurricane one-box system

High energy chirped pulse amplified femtosecond laser system

High energy chirped pulse amplified femtosecond laser system

H.TSHUDIN HTG 400